ZYGO NewView™ 9000 – 3D Optical Profiler

Versatile non-contact 3D surface metrology system for rapid measurement of surface topography, finish, form, dimensions and more. Based on innovative Coherence Scanning Interferometry (CSI) technology, the ZYGO NewView™ 9000 delivers versatility, precision, performance and value to address a wide range of surfaces and applications, from research to production.